Experimental RF Characteristics of Hot-Carrier-Stressed p-core Dual-Band VCO

Author: Jang Sheng-Lyang   Jain Sanjeev   Huang Jhin-Fang  

Publisher: American Scientific Publishers

ISSN: 1546-1998

Source: Journal of Low Power Electronics, Vol.9, Iss.2, 2013-08, pp. : 247-252

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract