Zinc oxide thin films on silicon carbide substrates (ZnO/SiC): electro-optical properties and electrically active defects

By Felix J F   Aziz M   de Araujo C I L   de Azevedo W M   Anjos V     Henini M  

Semiconductor Science and Technology, Vol. 29, Iss. 4, 2014-04 ,pp. : 45021-45029

IOP Publishing

Access to resources Recommend Favorite

Light Emission from Interface Traps and Bulk Defects in SiC MOSFETs

By Stahlbush R.E.   MacFarlane P.J.  

Journal of Electronic Materials, Vol. 30, Iss. 3, 2001-03 ,pp. : 188-195

Springer Publishing Company

Access to resources Recommend Favorite

Electrical and Optical Properties of Stacking Faults in 4H-SiC Devices

By Chen Bin  

Journal of Electronic Materials, Vol. 39, Iss. 6, 2010-06 ,pp. : 684-687

Springer Publishing Company

Access to resources Recommend Favorite

Study on the Thermoelectric Properties of CVD SiC Deposited with Inert Gases

By Kim Jun  

Journal of Electronic Materials, Vol. 40, Iss. 5, 2011-05 ,pp. : 840-844

Springer Publishing Company

Access to resources Recommend Favorite

Influences of ICP etching damages on the electronic properties of metal field plate 4H-SiC Schottky diodes

By Hui Wang   Yingxi Niu   Fei Yang   Yong Cai   Zehong Zhang   Zhongming Zeng   Minrui Wang   Chunhong Zeng   Baoshun Zhang  

Journal of Semiconductors, Vol. 36, Iss. 10, 2015-10 ,pp. : 104006-104011

IOP Publishing

Access to resources Recommend Favorite