Sensing Nanometer Depth of Focused Optical Fields with Scanning Surface Plasmon Microscopy

By Berguiga Lotfi  

Plasmonics, Vol. 8, Iss. 2, 2013-06 ,pp. : 715-722

Springer Publishing Company

Access to resources Recommend Favorite

New nanometer manipulators for surface research

By Anisimov V.V.   Deulin E.A.   Khramtsov S.V.   Mikhailov V.P.  

Vacuum, Vol. 47, Iss. 10, 1996-10 ,pp. : 1163-1166

Elsevier

Access to resources Recommend Favorite

Quantitative X-ray diffraction analysis of surface layers by computed depth profiling

By Luo J.   Tao K.  

Thin Solid Films, Vol. 279, Iss. 1, 1996-06 ,pp. : 53-58

Elsevier

Access to resources Recommend Favorite

Characterization of chalcogen bonding interactions via an in‐depth conceptual quantum chemical analysis

By  

JOURNAL OF COMPUTATIONAL CHEMISTRY, Vol. 39, Iss. 10, 2018-04 ,pp. : 557-572

John Wiley & Sons Inc

Access to resources Recommend Favorite

Laboratory experiment, field and remotely sensed data analysis for the assessment of suspended solids concentration and secchi depth of the reservoir surface water

By Choubey V. K.  

International Journal of Remote Sensing, Vol. 19, Iss. 17, 1998-11 ,pp. : 3349-3360

Taylor & Francis Ltd

Access to resources Recommend Favorite