Author： Jose K. K.
Publisher： Taylor & Francis Ltd
ISSN： 0361-0918
Source： Communications in Statistics: Simulation and Computation, Vol.41, Iss.10, 2012-11, pp. : 1805-1815
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
In this article, we investigated the bootstrap calibrated generalized confidence limits for process capability indices C pk for the one-way random effect model. Also, we derived Bissell's approximation formula for the lower confidence limit using Satterthwaite's method and calculated its coverage probabilities and expected values. Then we compared it with standard bootstrap (SB) method and generalized confidence interval method. The simulation results indicate that the confidence limit obtained offers satisfactory coverage probabilities. The proposed method is illustrated with the help of simulation studies and data sets.
Related content
Access to resources
Recommend
By Pathmanathan Dharini Ong S. H.
Journal of Statistical Computation and Simulation, Vol. 84, Iss. 11, 2014-11 ,pp. :