Author: Pan Jeh-Nan Lee Chun-Yi
Publisher: Taylor & Francis Ltd
ISSN: 0361-0926
Source: Communications in Statistics: Theory and Methods, Vol.38, Iss.8, 2009-01, pp. : 1133-1153
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
New generalization of process capability index Cpk
Journal of Applied Statistics, Vol. 25, Iss. 6, 1998-12 ,pp. :
The statistical monitoring of a complex manufacturing process
By Weighell M. Martin E.B. Morris A.J.
Journal of Applied Statistics, Vol. 28, Iss. 3-4, 2001-03 ,pp. :