Design of EWMA and CUSUM control charts subject to random shift sizes and quality impacts

Author: Chen Argon   Chen Y. K.  

Publisher: Taylor & Francis Ltd

ISSN: 0740-817X

Source: IIE Transactions, Vol.39, Iss.12, 2007-12, pp. : 1127-1141

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract