Author： Aksenov V.
Publisher： Taylor & Francis Ltd
ISSN： 0267-8292
Source： Liquid Crystals, Vol.32, Iss.7, 2005-07, pp. : 805-813
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Abstract
The deformation of oriented smectic liquid crystal elastomer films with smectic layers parallel to the film surface was studied using optical reflectometry and small angle X‐ray diffraction. Reflectometry data show that in the chosen material, in‐plane strain causes a change in the optical thickness of the free‐standing films. Small angle X‐ray scattering was used to explore the molecular origin of this effect. The X‐ray scattering data confirm that the change in optical thickness originates from the compression of the individual smectic layers. The measured Poisson ratio in the smectic A and C* phases is close to ½, in contrast to the smectic elastomers investigated earlier by Nishikawa et. al. [ Macromol. Chem. Phys . 200, 312 (1999)]. In this unique material, the molecular lattice dimensions can be reversibly controlled by macroscopic stretching of the oriented samples.
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