Modelling, control and simulation of an IC wafer fabrication system: a generalized stochastic coloured timed Petri Net approach

Author: Lin M-H.   Fu L-C.  

Publisher: Taylor & Francis Ltd

ISSN: 0020-7543

Source: International Journal of Production Research, Vol.38, Iss.14, 2000-09, pp. : 3305-3341

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Abstract