One-dimensional-based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstruction

Author： Tsai D. -M. Chuang S. -T. Tseng Y. -H.

Publisher： Taylor & Francis Ltd

ISSN： 0020-7543

Source： International Journal of Production Research, Vol.45, Iss.6, 2007-03, pp. : 1297-1321

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