Young's modulus memory effect during the annealing of submicrocrystalline copper

Author: Lebedev A. B.   Burenkov Y. A.   Kopylov V. I.   Romanov A. E.   Gryaznov V. G.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3036

Source: Philosophical Magazine Letters, Vol.73, Iss.5, 1996-05, pp. : 241-246

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Abstract