alpha Structural refinement of-Bi V O (x= 0 and 0.33 ) 4 2 11- x using high-resolution electron microscopy

Author: Zhou W.   Jefferson D. A.   Yuan J.   Smith D. J.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3036

Source: Philosophical Magazine Letters, Vol.75, Iss.2, 1997-02, pp. : 105-110

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