High-resolution electron microscopy of steps on misfitting lamellar gamma-alpha2 interfaces in a Ti-44at.% Al-8at.% Nb alloy

By Shang P.   Cheng T. T.   Aindow M.  

Philosophical Magazine Letters, Vol. 80, Iss. 1, 2000-01 ,pp. : 1-10

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A high-resolution electron microscopy study of steps on lamellar gamma-alpha 2 interfaces in a low-misfit TiAl-based alloy

By Shang P.   Cheng T. T.   Aindow M.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 79, Iss. 10, 1999-10 ,pp. : 2553-2575

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In situ high-resolution electron microscopy observation of grain-boundary migration through ledge motion in an Al-Mg alloy

By Song S. G.  

Philosophical Magazine Letters, Vol. 79, Iss. 8, 1999-08 ,pp. : 511-517

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The structure of antiphase domain boundaries in massively gamma transformed-TiAl studied by high-resolution electron microscopy

By Abe E.   Nakamura M.  

Philosophical Magazine Letters, Vol. 75, Iss. 2, 1997-02 ,pp. : 65-74

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Interface structure of Si3N4-whisker-reinforced Al-Mg-Si alloy (Al alloy 6061) composites studied by high-resolution electron microscopy

By Jeong H-G.   Hiraga K.   Mabuchi M.   Higashi K.  

Philosophical Magazine Letters, Vol. 74, Iss. 2, 1996-08 ,pp. : 73-80

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