Weak-beam transmission electron microscopy study of dislocation accommodation processes in nickel Sigma = 3 grain boundaries

By Poulat S.   Decamps B.   Priester L.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 77, Iss. 6, 1998-06 ,pp. : 1381-1397

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Nanoscopic crystallography of chalcopyrite CuInS2 by techniques of convergent-beam electron diffraction

By Leicht M.   Stenkamp D.   Strunk H. P.   Wolf D.   Eisner B.   Muller G.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 79, Iss. 5, 1999-05 ,pp. : 1033-1043

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Polarity determination of zinc oxide nanorods by defocused convergent-beam electron diffraction

By Nicholls D. P.  

Philosophical Magazine Letters, Vol. 87, Iss. 6, 2007-06 ,pp. : 417-421

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Analysis of ultrathin Ge layers in Si by large angle convergent beam electron diffraction

By Hovsepian A.   Cherns D.   Jaeger W.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 79, Iss. 6, 1999-06 ,pp. : 1395-1410

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Determination of bulk mismatch values in transmission electron microscopy cross-sections of heterostructures by convergent-beam electron diffraction

By Balboni R.   Frabboni S.   Armigliato A.  

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