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By Y.Huang J.   Park B. H.   Jan David   Pan X. Q.   Zhu Yuntian T.   Jia Q. X.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 82, Iss. 4, 2002-03 ,pp. : 735-749

Taylor & Francis Ltd

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High-resolution transmission electron microscopy study of pulsed laser beam crystallized Si thin film: The formation of hexagonal Si and defects

By Kim J.H.   Lee J.Y.  

Thin Solid Films, Vol. 292, Iss. 1, 1997-01 ,pp. : 313-317

Elsevier

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High-resolution transmission electron microscopy study of luminescent anodized amorphous silicon

By Bustarret E.   Sauvain E.   Ligeon M.  

Philosophical Magazine Letters, Vol. 75, Iss. 1, 1997-01 ,pp. : 35-42

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alpha Structural refinement of-Bi V O (x= 0 and 0.33 ) 4 2 11- x using high-resolution electron microscopy

By Zhou W.   Jefferson D. A.   Yuan J.   Smith D. J.  

Philosophical Magazine Letters, Vol. 75, Iss. 2, 1997-02 ,pp. : 105-110

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Atomic desorption process in nanometre-scale electron-beam drilling of MgO in high-resolution transmission electron microscopy

By Kizuka T.   Tanaka N.  

Philosophical Magazine Letters, Vol. 76, Iss. 4, 1997-10 ,pp. : 289-298

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