Author: Y. L. Hao
Publisher: Taylor & Francis Ltd
ISSN: 1362-3036
Source: Philosophical Magazine Letters, Vol.83, Iss.6, 2003-06, pp. : 375-386
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Point-defect concentrations in B2 NiAl alloys under pressure
By Erdélyi G. Guthy Cs. Beke D. L.
Philosophical Magazine, Vol. 83, Iss. 1, 2003-01 ,pp. :
By Johnson B.J. Kennedy F.E. Baker I.
Wear, Vol. 192, Iss. 1, 1996-03 ,pp. :
Study of Ni-Al interface formation
Thin Solid Films, Vol. 317, Iss. 1, 1998-04 ,pp. :