Measuring grain-boundary segregation in nanocrystalline alloys: direct validation of statistical techniques using atom probe tomography

Author: Detor A. J.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3036

Source: Philosophical Magazine Letters, Vol.87, Iss.8, 2007-08, pp. : 581-587

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract