Author: Parry-Jones L. A. Beldon S. M. Rodriguez-Martin D. Richardson R. M. Elston S. J.
Publisher: Taylor & Francis Ltd
ISSN: 0267-8292
Source: Liquid Crystals, Vol.29, Iss.8, 2002-08, pp. : 1001-1005
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
X-ray diffraction studies of porous silicon
Thin Solid Films, Vol. 276, Iss. 1, 1996-04 ,pp. :