The effect of surface steps on the critical thickness for spreading of threading dislocations in thin epitaxial films

Author： Hirth J. P.   Hoagland R. G.   Misra A.  

Publisher： Taylor & Francis Ltd

ISSN： 1478-6443

Source： Philosophical Magazine, Vol.85, Iss.26-27, 2005-09, pp. : 3019-3028

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Threading dislocations in epitaxial ferroelectric PbZr 0.2 Ti 0.8 O 3 films and their effect on polarization backswitching

By Vrejoiu I.   Le Rhun G.   Zakharov N. D.   Hesse D.   Pintilie L.   Alexe M.  

Philosophical Magazine, Vol. 86, Iss. 28, 2006-10 ,pp. : 4477-4486

Taylor & Francis Ltd

Access to resources Recommend Favorite

Critical thickness for dislocation generation in epitaxial piezoelectric thin films

By Wang Biao  

Philosophical Magazine, Vol. 83, Iss. 31-34, 2003-01 ,pp. : 3753-3764

Taylor & Francis Ltd

Access to resources Recommend Favorite

Interaction between surface structures and threading dislocations during epitaxial diamond growth

By  

PHYSICA STATUS SOLIDI (A) APPLICATIONS AND MATERIALS SCIENCE, Vol. 212, Iss. 11, 2015-11 ,pp. : 2480-2486

John Wiley & Sons Inc

Access to resources Recommend Favorite

Studies of threading dislocations in Nb(011) films

By Appleton R. S.   Swiech W.   Ondrejcek M.   Flynn C. P.  

Philosophical Magazine, Vol. 83, Iss. 14, 2003-05 ,pp. : 1639-1651

Taylor & Francis Ltd

Access to resources Recommend Favorite

Surface segregational behaviour studied as an effect of thickness by SIMS and AFM in annealed PS-PMMA blend and block copolymer thin films

By Kailas L.   Audinot J.N.   Migeon H.N.   Bertrand P.  

Composite Interfaces, Vol. 13, Iss. 4-6, 2006-06 ,pp. : 423-439

Taylor & Francis Ltd

Access to resources Recommend Favorite