Strain effect in the problem of critical thickness for ferroelectric memory

Author: Bratkovsky A. M.  

Publisher: Taylor & Francis Ltd

ISSN: 1478-6443

Source: Philosophical Magazine, Vol.90, Iss.1-4, 2010-01, pp. : 113-124

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract