Observation of the atomic structure of ß′-SiAlON using three generations of high resolution electron microscopes

Author: Thorel A.  

Publisher: Taylor & Francis Ltd

ISSN: 1478-6443

Source: Philosophical Magazine, Vol.93, Iss.10-12, 2013-04, pp. : 1172-1181

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract