Author: Epple M. Cammenga H.K. Sarge S.M. Diedrich R. Balek V.
Publisher: Elsevier
ISSN: 0040-6031
Source: Thermochimica Acta, Vol.250, Iss.1, 1995-02, pp. : 29-39
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Strain analysis by X-ray diffraction
Thin Solid Films, Vol. 319, Iss. 1, 1998-04 ,pp. :
X-ray diffraction investigation of porous silicon superlattices
By Buttard D. Bellet D. Baumbach T.
Thin Solid Films, Vol. 276, Iss. 1, 1996-04 ,pp. :