Optical properties of nanophase films measured by variable-angle spectroscopic ellipsometry

By Urban F.K.   Hosseini-Tehrani A.   Khabari A.   Griffiths P.   Bungay C.   Petrov I.   Kim Y.  

Thin Solid Films, Vol. 408, Iss. 1, 2002-04 ,pp. : 211-217

Elsevier

Access to resources Recommend Favorite

Spectroscopic ellipsometry of multilayer dielectric coatings

By Bhattacharyya D.   Sahoo N.K.   Thakur S.   Das N.C.  

Vacuum, Vol. 60, Iss. 4, 2001-03 ,pp. : 419-424

Elsevier

Access to resources Recommend Favorite

Characterization of inhomogeneous dielectric coatings with arbitrary refractive index profiles by multiple angle of incidence ellipsometry

By Tonova D.A.   Konova A.A.  

Thin Solid Films, Vol. 397, Iss. 1, 2001-10 ,pp. : 17-23

Elsevier

Access to resources Recommend Favorite

Applications of variable angle spectroscopic ellipsometry to strained SiGe alloy heterostructures

By Heyd A.R.   Alterovitz S.A.   Croke E.T.   Wang K.L.   Lee C.H.  

Thin Solid Films, Vol. 270, Iss. 1, 1995-12 ,pp. : 91-96

Elsevier

Access to resources Recommend Favorite

Optical characterization by spectroscopic ellipsometry of polycrystalline Si 1-x Ge x of variable Ge composition up to 100% Ge

By Ferrieu F.   Morin C.   Regolini J.L.  

Thin Solid Films, Vol. 315, Iss. 1, 1998-03 ,pp. : 316-321

Elsevier

Access to resources Recommend Favorite