Minority carrier lifetime in thin films of Zn 3 P 2 using microwave and optical transient measurements

Author： Fessenden R.W.   Sobhanadri J.   Subramanian V.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.266, Iss.2, 1995-10, pp. : 176-181

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