Structure and non-uniform strain analysis on p-type porous silicon by X-ray reflectometry and X-ray diffraction

Author: Lopez-Villegas J.M.   Navarro M.   Samitier J.   Papadimitriou D.   Bassas J.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.276, Iss.1, 1996-04, pp. : 238-240

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Abstract