Author: Takahashi H. Nagata H. Kataoka H.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.277, Iss.1, 1996-05, pp. : 132-137
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Emission spectroscopy of Ar-H 2 plasma
Vacuum, Vol. 61, Iss. 2, 2001-05 ,pp. :
Inversion-Channel MOS Devices for Characterization of 4H-SiC/SiO2 Interfaces
Materials Science Forum, Vol. 2015, Iss. 821, 2015-07 ,pp. :