Determination of optical constants and average thickness of thin films on thick substrates using angular distribution of intensity of reflected radiation

Author： Jaglarz J.   Nowak M.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.278, Iss.1, 1996-05, pp. : 124-128

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Determination of optical constants and average thickness of inhomogeneous-rough thin films using spectral dependence of optical transmittance

By Nowak M.  

Thin Solid Films, Vol. 254, Iss. 1, 1995-01 ,pp. : 200-210

Elsevier

Access to resources Recommend Favorite

Determination of the thickness and optical constants of thin films from transmission spectra

By Kubinyi M.   Benko N.   Grofcsik A.   Jones W.J.  

Thin Solid Films, Vol. 286, Iss. 1, 1996-09 ,pp. : 164-169

Elsevier

Access to resources Recommend Favorite

Determination of the thickness and optical constants of amorphous Ge-Se-Bi thin films

By Dahshan A.  

Philosophical Magazine, Vol. 89, Iss. 12, 2009-04 ,pp. : 1005-1016

Taylor & Francis Ltd

Access to resources Recommend Favorite

Estimation of the Optical Constants and the Thickness of Thin Films Using Unconstrained Optimization

By Birgin E.G.   Chambouleyron I.   Martínez J.M.  

Journal of Computational Physics, Vol. 151, Iss. 2, 1999-05 ,pp. : 862-880

Academic Press

Access to resources Recommend Favorite

Linear distribution of intensity of radiation reflected from and transmitted through a thin film on a thick substrate

By Nowak M.  

Thin Solid Films, Vol. 266, Iss. 2, 1995-10 ,pp. : 258-262

Elsevier

Access to resources Recommend Favorite