Comparative studies of TiN and Ti 1-x Al x N by plasma-assisted chemical vapor deposition using a TiCl 4 /AlCl 3 /N 2 /H 2 /Ar gas mixture

Author: Kim K.H.   Lee S.H.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.283, Iss.1, 1996-09, pp. : 165-170

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract