Study of defects in thin titanium films by positron annihilation spectroscopy

Author: Misheva M.   Djourelov N.   Kotlarova T.   Elenkov D.   Passage G.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.283, Iss.1, 1996-09, pp. : 26-29

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract