High-resolution electron energy loss spectroscopy of thin crystalline highly oriented films of poly(tetrafluoroethylene)

By Schott M.   Rei Vilar M.   Dannetun P.  

Thin Solid Films, Vol. 286, Iss. 1, 1996-09 ,pp. : 321-329

Elsevier

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Cantilever flexure, adhesive\attractive and lateral force measurements on highly-oriented pyrolytic graphite by scanning force microscopy

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Vacuum, Vol. 50, Iss. 3, 1998-07 ,pp. : 281-287

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Atomic force microscopy study of diamond-like atomic-scale composite films

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Sexithiophene thin films epitaxially oriented on polytetrafluoroethylene substrates: Structure and morphology

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Thin Solid Films, Vol. 303, Iss. 1, 1997-07 ,pp. : 207-212

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Sexithiophene thin films epitaxially oriented on polytetrafluoroethylene substrates: Structure and morphology

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