Conductivity dependence on the thickness of hydrogenated, amorphous silicon carbon films

Author: Arce R.D.   Buitrago R.H.   Bittencourt C.   Alvarez F.   Koropecki R.R.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.295, Iss.1, 1997-02, pp. : 287-294

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content