Characterization of porous silicon by Raman scattering and photoluminescence

Author: Zuk J.   Kulik M.   Andrews G.T.   Kiefte H.   Clouter M.J.   Goulding R.   Rich N.H.   Nossarzewska-Orlowska E.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.297, Iss.1, 1997-04, pp. : 106-109

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Abstract