Author: Suder S. Faunce C.A. Donnelly S.E.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.304, Iss.1, 1997-07, pp. : 157-159
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Hendrich C. Favre L. Ievlev D.N. Dobrynin A.N. Bras W. Hörmann U. Piscopiello E. Van Tendeloo G. Lievens P. Temst K.
Applied Physics A, Vol. 86, Iss. 4, 2007-03 ,pp. :
Transmission electron microscopy of thin-film transistors on glass substrates
By Tsujimoto K. Tsuji S. Kuroda K. Saka H.
Thin Solid Films, Vol. 319, Iss. 1, 1998-04 ,pp. :
Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 80, Iss. 3, 2000-03 ,pp. :
By Dorin Thomas Deschamps Alexis De Geuser Frédéric Lefebvre Williams Sigli Christophe
Philosophical Magazine, Vol. 94, Iss. 10, 2014-04 ,pp. :