Author: Li Y. Polaczyk C. Riegel D.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.317, Iss.1, 1998-04, pp. : 310-313
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Preparation and structure of AlW thin films
By Radic N. Tonejc A. Milun M. Pervan P. Ivkov J. Stubicar M.
Thin Solid Films, Vol. 317, Iss. 1, 1998-04 ,pp. :
Microhardness characterization of Al-W thin films
By Stubicar M. Tonejc A. Radic N.
Vacuum, Vol. 61, Iss. 2, 2001-05 ,pp. :