AES and EELS study of aluminium oxide thin films

Author: Kapsa R.   Stara I.   Zeze D.   Gruzza B.   Matoln V.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.317, Iss.1, 1998-04, pp. : 77-80

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract