Microstructure imaging of the YBCO thin film/MgO substrate interface: HRTEM and Fourier analysis of the Moire fringe pattern

Author: Auzary S.   Pailloux F.   Denanot M.F.   Gaboriaud R.J.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.319, Iss.1, 1998-04, pp. : 163-167

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Abstract