Raman spectroscopy and X-ray diffraction study of sol-gel derived (Pb 1-x La x )Ti 1-x/4 O 3 thin films on Si substrates

Author: Wu D.   Li A.-d.   Ge C.-Z.   Lu P.   Xu C.-Y.   Jian Xu   Ming N.-B.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.322, Iss.1, 1998-06, pp. : 323-328

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Abstract