Surface characterization of oriented silver films on Si (100) substrates using scanning tunnelling microscopy

Author: Ali A.O.   Kshirsagar R.B.   Dharmadhikari C.V.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.323, Iss.1, 1998-06, pp. : 105-109

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Abstract