High resolution chemical mapping in the energy-filtering TEM: application to interface layers in ceramics

Author: Ponsonnet L.   Vacher B.   Martin J.M.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.324, Iss.1, 1998-07, pp. : 170-175

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content