Thickness dependence of structural and ferroelectric properties of sol-gel Pb(Zr 0.56 Ti 0.44 ) 0.90 (Mg 1/3 Nb 2/3 ) 0.10 O 3 films

Author: Sumi K.   Qiu H.   Kamei H.   Moriya S.   Murai M.   Shimada M.   Nishiwaki T.   Takei K.   Miyashita S.   Hashimoto M.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.330, Iss.2, 1998-09, pp. : 183-189

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