Shape, size, strain and correlations in quantum dot systems studied by grazing incidence X-ray scattering methods

Author: Metzger T.H.   Kegel I.   Paniago R.   Lorke A.   Peisl J.   Schulze J.   Eisele I.   Schittenhelm P.   Abstreiter G.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.336, Iss.1, 1998-12, pp. : 1-8

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