Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.336, Iss.1, 1998-12, pp. : 347-349
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Optical transitions in Si/Ge superlattices
By Erkoc Katircioglu
Thin Solid Films, Vol. 295, Iss. 1, 1997-02 ,pp. :
Single-wafer Si and SiGe processes for advanced ULSI technologies
By Bodnar S. Morin C. Regolini J.L.
Thin Solid Films, Vol. 294, Iss. 1, 1997-02 ,pp. :
Preparation and optical properties of Ge and C-induced Ge quantum dots on Si
By Eberl K. Schmidt O.G. Kienzle O. Ernst F.
Thin Solid Films, Vol. 373, Iss. 1, 2000-09 ,pp. :