Effect of annealing conditions on the leakage current characteristics of ferroelectric PZT thin films grown by sol-gel process

Author: Cho S.M.   Jeon D.Y.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.338, Iss.1, 1999-01, pp. : 149-154

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract