Study of single and double Si -doped GaAs layers by spectral photoconductivity measurements

Author: Oswald J.   Pastrnak J.   Karel F.   Petrcek O.   Salokatve A.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.342, Iss.1, 1999-03, pp. : 262-265

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Abstract