The sensitivity limits of spectroscopic ellipsometry to oxygen content in YBa 2 Cu 3 O 7- thin films

Author: Gibbons B.J.   Trolier-McKinstry S.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.352, Iss.1, 1999-09, pp. : 205-212

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Abstract