Origins of defects in self assembled GaP islands grown on Si(001) and Si(111)

Author: Narayanan V.   Sukidi N.   Bachmann K.J.   Mahajan S.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.357, Iss.1, 1999-12, pp. : 53-56

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Abstract