Structural investigation of SiC epitaxial layers grown under microgravity and on-ground conditions

Author： Pecz B.   Yakimova R.   Syvajarvi M.   Lockowandt C.   Radamson H.   Radnoczi G.   Janzen E.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.357, Iss.2, 1999-12, pp. : 137-143

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