Nanocrystalline TiO 2 studied by optical, FTIR and X-ray photoelectron spectroscopy: correlation to presence of surface states

Author： Kumar P.M.   Badrinarayanan S.   Sastry M.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.358, Iss.1, 2000-01, pp. : 122-130

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