Damage study of ITO under high electric field

Author： He J. Lu M. Zhou X. Cao J.R. Wang K.L. Liao L.S. Deng Z.B. Ding X.M. Hou X.Y. Lee S.T.

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.363, Iss.1, 2000-03, pp. : 240-243

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