Examination of EL and PL properties of MCHM-PPV and MEH-PPV: a study towards introduction of a new series of thin film EL devices

Author: Choo D.J.   Talaie A.   Lee Y.K.   Jang J.   Park S.H.   Huh G.   Yoo K.H.   Lee J.Y.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.363, Iss.1, 2000-03, pp. : 37-41

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