Ellipsometric methods for absorbing layers: A modified downhill simplex algorithm

By Bosch S.   Monzonis F.   Masetti E.  

Thin Solid Films, Vol. 289, Iss. 1, 1996-11 ,pp. : 54-58

Elsevier

Access to resources Recommend Favorite

RBS and ellipsometric studies of near surface GaAs ion implanted layers

By Kulik M.   Herec J.   Romanek J.  

Vacuum, Vol. 63, Iss. 4, 2001-08 ,pp. : 761-766

Elsevier

Access to resources Recommend Favorite

Ellipsometric Porosimetry and Electrochemical Impedance Spectroscopy Characterization for Moisture Permeation Barrier Layers

By  

PLASMA PROCESSES AND POLYMERS (ELECTRONIC), Vol. 1612-8850, Iss. 9, 2015-09 ,pp. : 968-979

John Wiley & Sons Inc

Access to resources Recommend Favorite

Ellipsometric Porosimetry and Electrochemical Impedance Spectroscopy Characterization for Moisture Permeation Barrier Layers

By  

PLASMA PROCESSES AND POLYMERS (ELECTRONIC), Vol. 12, Iss. 9, 2015-09 ,pp. : 968-979

John Wiley & Sons Inc

Access to resources Recommend Favorite

A novel planarization process for polysilicon sacrificial layers in a micro-thermal system

By Chen H.R.   Gau C.   Dai B.T.   Tsai M.S.  

Sensors and Actuators A: Physical, Vol. 108, Iss. 1, 2003-11 ,pp. : 86-90

Elsevier

Access to resources Recommend Favorite